B029590 - EXPERIMENTAL METHODS FOR THE STUDY OF NANOSTRUCTURED MATERIALS

English

Theory and laboratory practice of techniques for the characterization of nanostructured materials. Microscopy: Optical microscopy and contrast techniques; Fluorescence and Confocal Microscopy; Super-resolution microscopy; Scanning and Transmission Electron Microscopy (SEM, TEM); Atomic Force Microscopy (AFM). Static and Dynamic Scattering: X-Rays, Neutrons, Light. Four laboratory practices: Confocal Microscopy, TEM and SEM, AFM, X-Ray Scattering.

1- D. B. Murphy: Fundamentals of Light Microscopy and Electronic Imaging, Wiley. 2- R. Egerton: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM, Springer. 3-G. Haugstad: Atomic Force Microscopy: Understanding basic modes and advanced applications, Wiley. 4- Lindner, Zemb Eds.: Neutrons, X-Rays and Light: Scattering methods applied to soft condensed matter, North Holland.

Aim of this course is to train students on modern characterization techniques for nanostructured materials in solution, from biological macromolecules and synthetic polymers, to nanoparticles and self-assemblies. The students will learn the basic theoretical principles underpinning experimental methods in direct and indirect space and will receive hands-on laboratory training on microscopic and scattering methods.

Knowledge of the physical chemistry of soft condensed matter and nanomaterials

Lectures, Interactive Tutorials, Laboratory Demonstrations

Most of the material will be present on the Moodle e-learning platform

Evaluation of the Reports of the Laboratory Practices, final project

Lectures
Direct Observation Techniques:
Optical Microscopy: a) Basics: The compound microscope; Image formation and Illumination paths in the compound microscope; Diffraction and interference in the microscope; Resolution; b) Contrast Techniques: Bright and Dark Field Microscopy; Phase Contrast; Fluorescence Microscopy; Confocal Microscopy; Super-resolution microscopy; c) Applications: Colloids, Polymers, Biological Systems

Electron Microscopy: a) Electron Optics: Electrostatic and magnetic lenses; b) Transmission Electron Microscopy (TEM): Components of a TEM microscopy; Elastic and inelastic electron scattering; Contrast principles in TEM; Specialized techniques; Applications: Nanomaterials, Colloids, Polymers, Biological Systems
d) Scanning electron microscope (SEM): Components of a SEM microscope; SEM modes: secondary emission and backscattering; Applications: Nanomaterials, Colloids, Polymers, Biological Systems.

Atomic Force Microscopy (AFM): Components: Tip, Cantilever, Detector, Feedback mechanism; Topography: Contact and Non-contact modes; Force Measurements: Force-indentation curves, Elasticity, Microrheology; Additional operation modes. Applications: Nanomaterials, Colloids, Polymers, Biological Systems.

Indirect Methods
Scattering Fundamentals; Radiation-Matter interaction and Contrast; Radiations: X-Rays, Light, Neutrons.
Static Scattering: Structural Properties. System with a discrete number of scatterers: Dilute Systems: Form Factor; Concentrated Systems: Interactions and Structure Factors; Length Scales and Scattering Vector; Ordered and Disordered Systems, Specialized Setups. Applications: Colloids, Polymers, Biological Systems

Laboratory practice

Microscopy:
1) Structure and dynamics of a colloidal dispersion using Confocal Microscopy
2) TEM and SEM investigation of colloidal and biological samples
3) Surface topography with the Atomic Force Microscope

Scattering:
4) Determination of a nanoparticle’s system form factor and structure factor using Small Angle X-Ray Scattering